
๐๐ฃ๐๐ ๐ฎ๐ฌ๐ฎ๐ฑ: ๐ฐ๐ผ๐น๐น๐ฎ๐ฏ๐ผ๐ฟ๐ฎ๐๐ถ๐ผ๐ป ๐๐ถ๐๐ต ๐๐ป๐ณ๐ถ๐ป๐ฒ๐ผ๐ป ๐น๐ฒ๐ฎ๐ฑ๐ ๐๐ผ ๐ฒ๐ ๐ฐ๐ถ๐๐ถ๐ป๐ด ๐ป๐ฒ๐ ๐ฝ๐ฎ๐ฝ๐ฒ๐ฟ!
During this yearโs IPFA conference we are excited to present a new paper with our customer Infineon Technologies โ๐๐ฆ๐ท๐ฐ๐ญ๐ถ๐ต๐ช๐ฐ๐ฏ๐ช๐ป๐ช๐ฏ๐จ ๐๐ ๐๐ข๐ค๐ฌ๐ข๐จ๐ฆ ๐๐ฆ๐ค๐ข๐ฑ๐ด๐ถ๐ญ๐ข๐ต๐ช๐ฐ๐ฏ ๐ธ๐ช๐ต๐ฉ ๐๐ช๐ค๐ณ๐ฐ๐ธ๐ข๐ท๐ฆ-๐๐ฏ๐ฅ๐ถ๐ค๐ฆ๐ฅ-๐๐ญ๐ข๐ด๐ฎ๐ข (๐๐๐) ๐๐บ๐ด๐ต๐ฆ๐ฎโ, demonstrating new solutions to the industries challenges with preserving the Nickel-plating layer on the lead finger for repackaging, preservation of Cu wires in Film Over Wire (FOW) stacked-die device decapsulation. Failure analysis involves a series of steps to identify the root cause of a failed semiconductor IC. Current methods like acid or laser etching often damage these



